Transmission electron microscopy (Tecnai G2 F20 U-TWIN)

Scanning electron microscopy analysis types:

• Image acquisition of nanoscale objects (conductive and non-conductive) by methods of TEM, such as:
  • nanoparticles (nanopowders),
  • nanorods,
  • nanofibers,
  • nanotubes,
  • nanowires,
  • nanodisks
  with the spatial resolution down to 0.2 nm.
• Image analysis obtaining quantitative data about the size and shape of nano-objects, and the degree of agglomerable.
• Image acquisition by the TEM method of the sample structure of nanostructured materials with the spatial resolution down to 0.2 nm.
• Obtaining the surface stereoscopic topography images.
• Image analysis to afford quantitative data about the size and shape of the nanocrystals (granules), long intercrystallite boundaries and other features of the structure.
• Preparation by the TEM method pictures of cross section structures and sample surfaces of nanostructured thin object (conductive or nonconductive), including thin films, coatings, nanochips electrolyte and electrode structures with a spatial resolution down to 0.2 nm.
• Obtaining of the numerical data on the size of layers, the size and shape of the nanocrystals (granules), pores, intercrystallite boundaries, inter-layer interfaces and other features of the structure.
• Analysis of chemical elements distribution in the object (based on X-ray analysis).
• Investigation of point and line defects in materials - vacancies and dislocations.
• Potential distribution analysis of the complicated microproducts (Volts contrast).
• Investigation of magnetic field distribution in the sample (magnetic contrast).
• Microproducts metrology.